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Your guide to Optical Micrometers
Guide Topics
Optical Micrometers
Optical Micrometers/Classification
Operating Principle
Glossary
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Optical Micrometers
  

Optical Micrometers/Classification

Overview
Thrubeam measuring instruments measure the outer diameter, height, width, or thickness of an object, etc. These instruments can also be used for runout, positioning, and dimension measurement. The measurement method includes:
1. Laser beam scans a target, and the target dimension is calculated based on the timing of the shadow produced due to laser beam interruption by the target.
2. A beam of light converges into a parallel beam and is projected onto a target. The shadow produced due to light being interrupted by the target is detected using a CCD image sensor or photodiode. Operating principles and features of devices using the laser scanning method and the CCD or photodiode method are described below.

Classification
Detection method High-accuracy CCD method Scanning method CCD method Two-dimensional CCD method
Features
High speed, high accuracy.
Transparent target measurement is possible.
High-speed resolution and high accuracy
Transparent target measurement is possible.
High-speed sampling
Simultaneous measurements at multiple points on a plane
Measurement of inner diameter, radius, angle, etc.
Appearance Sensor head High-accuracy CCD Scanning method CCD Two dimensional scanning
Controller
(or amplifier)		 Controller Controller Controller Dedicated measurement software for PC is used.
Model LS-7000 Series LS Series VG Series VM Series
Item
 Resolution 0.01µm 0.05µm 1µm 1µm
Measuring accuracy ±0.5µm ±2µm 0.1％ of F.S.
(FS＝30mm)		 ±5µm
Measuring range 0.002 to 1.18in 0.003 to 4.72in 0.02 to 1.38in 0.01 to 1.57in
Sampling rate 2400 scans/s 1200 scans/s 780 scans/s About 1 second


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